QRM QRM-MicroBar测试卡，QRM-MicroBar测试模体,Micro-CT高分辨率测试卡技术指标 基础材料： 固体塑料（切屑放在空气中的支撑件上-壁厚> 0.3 mm） 直径幻影： 5.2毫米 高度： 19毫米 硅芯片的措施： 3 x 3 x 0.66毫米 芯片上的结构（分辨率）： 分别为1至10 μm。500至50 LP / mm 芯片材质： 硅 图案对比 硅/空气
As a further development of our popular MicroCT-BarPattern-Phantom we now present the BarPattern-NANO!
The easy and convenient to use phantom provides two silicon chips, perpendicularly aligned and placed on a solid plastic support. Both 3 x 3 mm2 chips exhibit several line and point pattern representing lines and points of 1 to 10 μm width.
In addition a slented edge (L) and a Siemens-star (actinomorphic star) are also placed on the chip. The different structures on the chip are arranged in such a way over the chip, that spatial resolution can be determined in the center as well as in the peripheral regions of the image/chip with a single measurement.
Line- and Pointpattern on the chip: 3 x 3 mm2 The depth of the structures varies within 5 and 15 μm.
Specifications Base material: solid plastic (chips placed on support in air -> 0.3 mm wall thickness) Diameter Phantom: 5.2 mm Height: 19 mm measures of silicon chip: 3 x 3 x 0.66 mm structures on the chip (resolution): 1 to 10 μm, resp. 500 to 50 LP/mm Material of chip: silicon Contrast of pattern silicon / air
